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39th International Conference on Advanced Nanotechnology & Nano Electronics, will be organized around the theme “Theme : ”
Advanced Nano – 2023 is comprised of keynote and speakers sessions on latest cutting edge research designed to offer comprehensive global discussions that address current issues in Advanced Nano – 2023
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Helium ion microscopy has been primarily been used in high- discrepancy imaging of inorganic accoutrements; still,24, there have been some limited cases where it has been used in imaging of natural samples. The scanning helium microscope ( is a new form of microscopy that uses low energy( 5- 100 meV) neutral helium tittles to image the face of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and separating shells.